固定型故障的英文
stick at fault
例句与用法
- With the development of manufacturing technology of digital integrated circuit , the voltage test method based on stuck - at fault model can not detect all the faults in modern integrated circuit
随着集成电路制造技术的发展,基于固定型故障模型的电压测试技术越来越不能满足高性能集成电路的需求。 - The test vector set of the circuit can be obtained through constructing a test bdd . compared with the traditional algorithms , this method avoids enormous backtracking process . the second application is the network reliability based on bdd
Bdd应用于数字电路的固定型故障检测，建立的故障节点的检测bdd可以比较方便地得出电路故障的测试矢量，相比传统的测试算法，避免了庞大的反向回溯过程。 - For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。
