横向结晶的英文

transcrystallization

例句与用法

Device degradation behaviors of typical - sized n - type metal induced lateral crystallized polycrystalline silicon thin film transistors were investigated under two kinds of dc bias stresses : hot carrier stress and self - heating stress
本文主要研究了典型尺寸的n型金属诱导横向结晶多晶硅薄膜晶体管在两种常见的直流应力偏置下的退化现象:热载流子退化和自加热退化。