Uv - vis and xrd measurements revealed the facts that there were neither detectable electronic interactions between the two species nor interpenetration and complexion between these two components . while the esr and xps measurement results indicated that there happened a process of photoinduced , oriental and partial electron transfer between chlorodiane blue azo and tiopc molecules 紫外-可见光谱( uv - vis )和x -射线衍射( xrd )测试结果表明基态下两种材料之间没有明显电子态相互作用和两种分子间的穿插与缔合。
Highly c - axis oriented zno thin films were also grown on si ( 001 ) substrate by the present technique . in electrometer resistance meter , ultraviolate - visable spectrophotometer , spectroscopic ellipsometer were used to measure the electrical and optical properties . the results for the electrical properties of the thin films are revealed that the doping of li and mg could increase the electrical resistivity of the films , the highest electrical resistivity value was 11 . 18x 107qcm , which can meet the demands of piezo - electrical devices 同时运用高阻仪、紫外可见光谱、棱镜耦合仪等对掺li和mg的氧化锌薄膜光电性能以及能带结构进行了研究，可以得出以下结论：合适量的掺li和mg有利于提高氧化锌薄膜的电阻率，其最大值可达11 . 18 10 ~ 7 cm ，完全满足氧化锌薄膜作为一种压电薄膜的应用。
