The composition of sample was identified by means of x - ray diffractometer ( xrd ) . magnetic properties were measured by vibrating sample magnetometer ( vsm ) . the combustion behavior and crystallization process of the gel were studied by means of differential thermal analysis - thermogravimetric analysis ( dta - tg ) 利用x射线衍射仪( xrd )确定样品物相，振动样品磁强计( vsm )进行磁性测量，综合热分析仪研究凝胶的燃烧和析晶过程，扫描电子显微镜( sem )和透射电子显微镜( tem )观察粉末的形貌与粒度。
This paper has first summarized the experiment of granular film and theoretical research progress and the present major problem to be solved , has discussed the purpose meaning of this paper on this foundation , has introduced us soon afterwards with magnetic metal - non - magnetic metal material adopt for studying object to co - vapored deposited system such as the fexcu1 - x of different fe content x granular film sample , carrying out annealing handling for some of samples , using x ray diffraction instrument xrd ) , , scanning electrical microscopic ( sem ) , vibrating sample magnetometer ( vsm ) the tiny structure for sample , appearance and the magnetic result that can carry out detection 本文首先综述了颗粒膜的实验和理论研究进展情况和目前待解决的主要问题，在此基础上论述了本文的目的意义，随后介绍了我们以磁性金属?非磁性金属材料为研究对象，采用共蒸发法制备不同fe含量x的fe _ xcu _ ( 1 - x ) ，颗粒膜样品，对部分样品进行退火处理。给出了用x射线衍射仪( xrd ) 、扫描电镜( sem ) 、振动样品磁强计( vsm )对样品的微结构、形貌及磁性能进行检测的结果。
We introduce the fabrication of all samples and anneal of fexcu ( 1 - x ) granular film in detail . the configuration of granule film is investigated by scanning tunneling microscope ( stm ) . the matter phase is analyzed by x - ray diffraction ( xrd ) . the hysteresis loop of co / al2o3 / feni magnetic tunnel junction is studied by vibrating sample magnetometer ( vsm ) . we use microresistance test system ( mts ) to investigate the character of resistance , conductance , voltage and current 用扫描电子显微镜( stm )观察颗粒膜样品的表面形貌；用x ?射线衍射仪( xrd )对颗粒膜样品进行物相分析；用振动样品磁强计( vsm )对co al _ 2o _ 3 feni隧道结的磁滞回线作了研究；用微电阻测试系统对样品电阻、电导、电流、电压相关特性进行详细的研究。
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ) . the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different . the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique . by using atomic force microscope ( afm ) measured surface roughness of thin films . the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ) . the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ) . in addition , the giant magnetoresistance ( gmr ) effects of different films were also measured . the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage 利用掠入射x射线分析( gixa )技术对不同cu - fe薄膜的相结构进行了研究;利用xrd扫描及不同角度的2扫描对薄膜进行了结晶织构及残余应力分析;运用小角x射线散射( saxs )技术测量了薄膜的厚度;采用原子力显微镜( afm )观察了薄膜的表面形貌;运用能量损失谱( eds )及x射线荧光光谱( xrf )对薄膜进行了成分标定;使用振动样品磁强计测量了不同cu - fe过饱和固溶体薄膜的磁性能;最后利用自制的磁阻性能测试设备测量了真空磁场热处理前后不同薄膜的巨磁阻值。
