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磁强计测量的英文

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"磁强计测量"怎么读用"磁强计测量"造句

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  • magnetometer survey

例句与用法

  • Superconductivity - ac loss measurements - magnetometer methods for hysteresis loss in cu nb - ti multifilamentary composites
    超导性.交流电损耗测量. cu nb - ti多丝复合超导体磁滞损耗的磁强计测量
  • Superconductivity - part 13 : ac loss measurements ; magnetometer methods for hysteresis loss in cu nb - ti multifilamentary composites
    超导性.第13部分:交流电损耗测量. cu nb - ti多芯复合超导体磁滞损耗的磁强计测量
  • By using x - ray diffraction ( xrd ) and vibrating - sample magnetometer ( vsm ) we find about 260 c is the critical temperature to complete the transformation of ordered anti - ferromagnetic fct phase
    通过x光衍射和振动样品磁强计测量我们发现260大体上仍然是形成反铁磁相的临界温度。
  • Afm measurement indicates that the surface roughness of films is different with difference of fe content , and the films all represent self - assembly phenomenon . the results of the magnetic properties measurement reveal that in the assputtered films , the more fe content in the film , the higher the magnetic properties of the film
    利用振动样品磁强计测量不同cu - fe过饱和固溶体薄膜的磁性能,结合eds及xrf对薄膜成分标定的结果,表明沉积态薄膜的磁性能随薄膜中的fe含量的增加而增强。
  • The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ) . the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different . the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique . by using atomic force microscope ( afm ) measured surface roughness of thin films . the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ) . the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ) . in addition , the giant magnetoresistance ( gmr ) effects of different films were also measured . the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
    利用掠入射x射线分析( gixa )技术对不同cu - fe薄膜的相结构进行了研究;利用xrd扫描及不同角度的2扫描对薄膜进行了结晶织构及残余应力分析;运用小角x射线散射( saxs )技术测量了薄膜的厚度;采用原子力显微镜( afm )观察了薄膜的表面形貌;运用能量损失谱( eds )及x射线荧光光谱( xrf )对薄膜进行了成分标定;使用振动样品磁强计测量了不同cu - fe过饱和固溶体薄膜的磁性能;最后利用自制的磁阻性能测试设备测量了真空磁场热处理前后不同薄膜的巨磁阻值。
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