ellipsometer中文什么意思

发音:

用"ellipsometer"造句

偏振光椭圆计

偏振光椭圆率测量仪

椭率计

椭圆率计

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reflecto-ellipsometer: 反射式椭圆率测定仪
autocollimation-type ellipsometer: 自准直型椭圆偏振计
ellipsometer oxide thickness measurement: 氧化物厚度的椭圆计测量

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例句与用法

Their structures and optical properties were compared and analyzed . 2 the silver films were prepared at the room temperature and 77k on glass substrates . the microstructures and optical properties of the ag films were studied with the xrd , sem and ellipsometer , respectively
常温和77k温度玻璃衬底上金属（ ag 、 cu ）薄膜的制备，以及常温和77k玻璃衬底上ag薄膜的表面结构及光学性质的比较研究。
3 . the low dielectric silicate films were prepared by using poss sol - gel from hydrolyzation and condensation of y - methyl acryloyloxy propyl - triethoxysilane as template , and characterized by afm , bet and ellipsometer . a film with dielectric constant as low as 2 . 7 was obtained
3 、利用- (甲基丙稀酰氧)丙基三甲氧基硅烷水解缩和得到的poss溶胶作为模板剂制备得到了低介电薄膜材料，讨论了旋膜转速对薄膜厚度的影响。
At last , the designed hr phase retardance films are produced by use of the e - beam evaporation equipment , then the phase retardance and the reflection of it are measured by lambda 900 spectrophotometer and the type of m - 2000ui ellipsometer . and the error of hr phase retardance film is analyzed
在此膜系的基础上，通过对最外面几层薄膜厚度的优化设计，最终设计出了45入射、对632 . 8nm和1315nm双波长高反，并在1315nm处有180和90位相延迟的高反射膜系。
In this work , the author gave full - scale introduction for nano - materials about its structure and specialty , the application in practice and the progress in our country at present etc ; introduced and discussed the preparation , the structure and character of several nano - films ; explained in details the theory of the ellipsometer which measures the optical constants of the materials
本文对纳米材料的定义、结构特征及应用和我国纳米材料发展的现状作了较全面的介绍；对薄膜的制备、结构、特征进行了介绍和讨论；还详细介绍了测量材料光学性质的仪器? ?椭圆光谱偏振仪的结构原理及数据的处理方法。
The measure of ellipsometer shows : the refractive index value of c60 cluster films in gas atmosphere is smaller than that of vacuum c60 films ( our measurement result is 1 . 94 ) and refractive index value of c60 cluster films in ar is larger than that in n2 . both refractive index values are nearly the same in lower pressure ( about 1 . 46 ) , but decrease with increasing gas pressure
椭偏仪测量表明：气氛条件下制备的c60薄膜的折射率n比在真空条件下制备的c60薄膜的折射率( 1 . 94 )小；在低压强条件下，不同气氛中制备的样品的折射率也几乎相等；在一定的压强范围内，折射率随着压强的增大而减小。