临界厚度的英文

• critical thickness

• "临界"英文翻译    critical; crisis; criticalit ...
• "厚度"英文翻译    thickness; land
• "绝缘的临界厚度" 英文翻译 :    critical thickness of insulation
• "无限平板的临界厚度" 英文翻译 :    critical thickness of an infinite slab
• "临界分辨厚度" 英文翻译 :    critical resolution thickness
• "临界油膜厚度" 英文翻译 :    oil film critical thickness
• "临界动量损失厚度" 英文翻译 :    critical momentum thickness
• "临界润滑膜厚度" 英文翻译 :    critical thickness of oil film
• "厚度" 英文翻译 :    thickness; land (刀刃的)
• "临界" 英文翻译 :    [物理学] critical; crisis; criticality◇临界角 [光学] critical angle; angle of nonslip point; 临界力 critical force; 临界量 critical quantity; 临界面 critical surface; 临界球 critical sphere; 临界区 [流] critical region; critical zone; 临界速度 [流] critical speed; critical velocity; decision speed; thrashing speed; whirling speed; 临界态 critical state; 临界体积 [物理学] critical volume; critical size; 临界条件 critical condition; 临界温度 critical temperature; 临界载荷 critical load; 临界转数 critical revolutions; 临界转速 [机械工程] critical speed; critical speed of revolution; 临界装置 [核物理] critical assembly; 临界状态 criticality; critical state; critical behaviour; 临界最大值 critical maximum
• "总厚度，全厚度" 英文翻译 :    full thickness
• "板厚度" 英文翻译 :    plate thickness
• "半厚度" 英文翻译 :    half thickness; half-thickness
• "壁厚度" 英文翻译 :    lvwt; rwt; wall thickness
• "冰厚度" 英文翻译 :    ice thickness
• "层厚度" 英文翻译 :    frozen layer fraction; layer thickness; layer thinner
• "稠厚度" 英文翻译 :    consistency
• "大厚度" 英文翻译 :    heavy section
• "带厚度" 英文翻译 :    tape thickness
• "等厚度" 英文翻译 :    uniform thickness
• "厚度比" 英文翻译 :    thickness ratio
• "厚度表" 英文翻译 :    thickness apparatus
• "厚度病" 英文翻译 :    pachydermia
• "厚度规" 英文翻译 :    feeler gauge; finger gage; thick gauge; thickness gage; thickness gauge; thickness meter; thickness piece
• "厚度计" 英文翻译 :    idometer; micrometer; pachymeter; thickne gauge; thickness gage; thickness gauges; thickness meter; thickness scale; thickness tester

• Critical thickness analysis of base plate gushing in cylindrical foundation pit with confined water
  承压水作用下圆形基坑底板突涌的临界厚度计算公式
• High strength and stiffness can be achieved only in polymer films thinner than a critical thickness . the relationship between the microstructure and mechanical behaviors of conducting ppy films was described based on sem techniques at the first time
  同时，这些导电高分子薄膜材料的力学性能受薄膜厚度的影响：在某一临界厚度内其力学性能非常优异，超过这一厚度力学性能有所下降。
• Prior to the growth , the critical thickness , which plays a vital role in the formation process of qd , is numerically calculated in terms of the strain relaxation , and the growth is carried out under the guidance of the calculated results
  在stranski - krastanow ( s - k )模式下制备了zncdse量子点，在生长量子点之前，先数值计算了系统的临界厚度，然后在该临界厚度值的指导下进行了量子点的制备。
• By reading papers on debris flow ' s triggering and confluence , we know that if we consider debris flow ' s triggering and confluence as a whole system , its whole process have many critical characteristic situation . such as , critical slope grade , critical thickness of earth source , critical precipitation , critical runoff and critical velocity of flow
  本文通过对泥石流产汇流研究现状的分析得知，泥石流的产汇流可作为一个系统来研究，泥石流产汇流过程具有一系列临界特征值，如：临界坡度、土源临界厚度、临界雨量、临界流量和临界流速。
• The theoretical calculation and explanation of strain behavior during heteroepitaxy of oxides thin films : when the lattice mismatch is relative small ( for example , batio _ 3 / srtio _ 3 with a lattice mismatch of 2 . 18 % ) , the growth mode of thin films is layer - by - layer , and the critical thickness and strain relaxation can be calculated or estimated by matthews - blakeslee expressions ; when the lattice mismatch is large ( for example mgo / srtio _ 3 with lattice mismatch of 8 % ) , the strain relaxation process can be explained by theory of coherent strained islands
  氧化物薄膜异质外延应变行为的理论预测和解释。对于晶格失配较小的外延体系(如batio3 / srtio _ 3 2 . 18 % ) ,薄膜以层状方式进行生长,临界厚度和应变释放过程可以用经典的matthews - blakeslee公式进行预测;对于晶格失配较大的体系(如mgo / srtio _ 3 8 % ) ,薄膜以岛状方式进行生长,应变释放过程可以由弹性应变岛的理论体系进行解释。
• When increasing the oxygen pressure , the rheed pattern changes to streaky one again . this rheed pattern transformation induced by the oxygen pressure is reversible . ex situ xps results indicate that the element ni of lno film deposited in the relatively low oxygen pressure with thickness below the critical value exists in the form as ni2 + , while as ni3 + in the relatively high oxygen pressure
  随着膜厚增加而超过约30nm的临界厚度时,越来越多的晶格氧会移动到了薄膜表面,此时所提供的氧将使得后续生长的lno膜层重新形成钙钛矿结构,并以层状方式外延生长。