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特征谱线的英文

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"特征谱线"怎么读用"特征谱线"造句

英文翻译手机手机版

  • characteristic spectral line

例句与用法

  • The method was developed for the matrix determination and the component analysis by the character line in ni - based alloy based on digital simulation
    在镍基合金可见光谱计算机模拟基础上,研究利用镍元素及成分元素特征谱线进行基体鉴别和成分元素分析的方法。
  • Based on the results from the study , a method for matrix differentition and qualitative and semi - quantitative component analysis for cu - based alloy was developed with bright application prospect
    利用铜元素及成分元素特征谱线进行了基体鉴别和成分元素分析,研究结果可用于合金基体鉴别及铜合金成分元素的定性和半定量分析。
  • Similarly , in the spectrum of a star moving towards us , the characteristics lines would show a “ blue shift ” , i . e . , they would be displaced towards the blue end of the spectrum , corresponding to shorter wavelengths and higher frequencies
    同样,在向我们靠近的恒星的光谱上,特征谱线会显示“蓝移” ,即谱线移向蓝端,就是说波长短而频率高。
  • Observation of the on - off sequencing of characteristic spectral lines from tracer materials arranged in layers in , or surface patterns on , planar or spherical targets can provide a record of radial or lateral energy transport processes in laser - generated plasmas
    测量激光聚变靶产生的软x射线时间变化连续谱的形状,可以知道许多x射线产生过程的详细动态记录,这有助于理解实验的热学条件。观察轨迹特征谱线的闭合序列,能提供关于激光等离子体激发能量和滞后能量的传输过程记录。
  • The spectral correlation density must be estimated before the ds signal parameter estimation . in order to reduce the effect of random noise , we provide a improved method to estimate the spectral correlation density which is based on the average algorithm . it can make the spectral line be more obvious , and improved the snr limit when estimating these parameters
    在利用ds信号谱相关域所表现的特征进行参数估计时,首先要利用有限时间数据对ds信号进行谱相关密度估计,为降低随机噪声对谱相关密度估计的影响,本文引入了集平均的思想,提出采用集平均的方法估计谱相关密度,从而在参数估计时,特征谱线更显著,提高了参数估计的信噪比容限。
  • The variation of the film composition can be monitored by using the method of spectrum analysis during the film deposition ( for the intensity of the persistent line is proportional to the particle density of the element in the vacuum chamber ) . the measurement of the transmission spectrum of the film on a transparent substrate can be used to calculate the film parameters , such as refractive index , extinction coefficient and the thickness of the film . therefore , the combination of the two methods would be helpful to on line monitoring the film constituents and the optical paramenters in the preparation of thin films
    在制备薄膜的过程中,利用光谱分析的方法,以放电光谱特征谱线强度的变化来反映相应物质成分的变化,以连续光谱光源发出的光透射过薄膜的透射率的变化,来反映薄膜的厚度、折射率、吸收系数等光学参数的变化,从而达到在制膜过程中,对薄膜的成分、厚度等参数进行在线监控的目的
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