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电路可靠性的英文

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"电路可靠性"怎么读用"电路可靠性"造句

英文翻译手机手机版

  • circuit reliability
  • circuit reliavility

例句与用法

  • Computer aided modelling means for the reliability of the state control circuit of esa
    系统状态控制电路可靠性的计算机辅助建模方法
  • Circuits tolerance analysis covers subjects of circuits analysis , computational mathematics , digital simulation , physics of failure etc . it is a key technology to enhance the reliability of circuits
    电路的容差分析涉及电路分析、计算数学、数字仿真、失效物理等多个领域,是提高电路可靠性的关键技术。
  • Also , the principle of cas module of the reliability simulator bert 2 . 0 is given and a 11 stage ring oscillator is used as an example for bert to predict the lifetime of devices and circuits
    概述了电路可靠性模拟软件bertz刀的cas ( circuitagingsanulator )模块的基本原理:并以十一级环振为例,运用rh刀进行了其中各个器件和总的电路寿命的预测。
  • Based the background of reliability technology study on one certain type of power conditioning system of icf , this paper will keen on circuit tolerance analysis problems found in the system reliability design phase . the work is funded by the national " 863 " project
    本文以国家“ 863 ”项目某型惯性约束聚变( icf )设施的能源系统电路可靠性技术研究为背景,针对其中存在的系统可靠性设计的电路容差分析问题开展研究。
  • This thesis aims at discussing the model of manufacturing defects , the principles of soft and hard faults induced by manufacturing defects , the effects of soft fault on circuit reliability and yield and the relationship between yield loss and reliability decrease caused by manufacturing defects . the author ' s main contributions are as following : reliability and yield are two significant factors to semiconductor manufacture . based on the principles of the manufacturability engineering , the thesis discusses the effects of the manufacturing defect on the functional yield , parametric yield and the reliability for ics , and abstracts geometric models from actual chips
    本文对集成电路制造缺陷模型、由制造缺陷导致的软、硬故障的作用机理、软故障对电路可靠性和成品率的影响以及由制造缺陷导致的电路成品率的损失和可靠性下降之间的关系进行了系统的研究,主要研究结果如下:可靠性和成品率是影响半导体生产的两个主要因素,本文首先从集成电路的可制造性工程理论出发,讨论了制造缺陷在影响集成电路功能成品率、参数成品率和可靠性方面的作用。
  • Finally , according to the mosfet ' s parameter degradation due to hot - carrier effects and different application environment of mos devices on analog and digital circuits , the circuit structures for hot - carrier immunity are proposed for digital applications by adding a schottky diode in series with the drain of the nmosfet suffered heavily from hot - carrier degradation . ,
    即在受热载流子退化效应较严重的n mosfet漏极串联一肖特基二极管的新型cmos数字电路结构和串联一工作于线性区的常开n mosfet的mos模拟电路结构。经spice及电路可靠性模拟软件bert2
  • It also owns the specialty design capacity for electrical circuitry , software , pcblayout , analysis and test of circuit reliability , products safety regulation , electromagnetism compatibility , plane design and plastic mould . the company adopts the world advanced manufacturing technology and management methods and makes use of the world latest study achievements in specialty display field extensively . the company possess of leading core technology system
    我们拥有crt lcd显示器设计室和产品可靠性实验室,具有电子线路软件pcblayout电路可靠性分析测试产品安规电磁兼容平面设计塑胶模具等专业设计能力,因地制宜地采用世界上先进的制造技术和管理方法广泛利用世界专用显示领域的最新研究成果,拥有领先的核心技术体系。
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