瞬态电流的英文

• transient current

• "瞬态"英文翻译    transient; instantaneous con ...
• "电流"英文翻译    electric current
• "瞬态电流补偿" 英文翻译 :    transient current offset
• "瞬态电抗" 英文翻译 :    transient reactance
• "瞬态电路" 英文翻译 :    transient circuit
• "瞬态电压" 英文翻译 :    transient voltage
• "瞬态电阻" 英文翻译 :    transient resistance
• "交轴瞬态电抗" 英文翻译 :    quadrature axis transient reactance
• "交轴瞬态电压" 英文翻译 :    quadrature axis transient voltage
• "起始瞬态电抗" 英文翻译 :    subtransient reactance; subtransientreactance
• "瞬态电磁元件" 英文翻译 :    transient magnistor
• "瞬态电压调整" 英文翻译 :    transient voltage regulation
• "闭态电流" 英文翻译 :    off-state current
• "定态电流" 英文翻译 :    steady state current; steady-state current
• "断态电流" 英文翻译 :    off state current
• "关态电流" 英文翻译 :    off state current; off-state current
• "静态电流" 英文翻译 :    current, quiescent; quiescen current; quiescent current; resting current
• "开态电流" 英文翻译 :    on state current
• "零态电流" 英文翻译 :    zero state current
• "通态电流" 英文翻译 :    on state current
• "稳态电流" 英文翻译 :    steady state current; steady-state current; steadystatecurrent
• "很强的瞬态电磁" 英文翻译 :    esd emp
• "交轴起始瞬态电抗" 英文翻译 :    quadrature axis subtransient reactance
• "交轴起始瞬态电压" 英文翻译 :    quadrature axis subtransient voltage
• "瞬态电路分析程序" 英文翻译 :    transient circuit analysis program

• The stuck - open faults are simulated concurrently based on iddt testing with the test pattern pairs generated above
  利用测试生成的向量对，采用瞬态电流测试方法对开路故障进行并发故障模拟。
• The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method , and increase fault coverage
  瞬态电流测试方法可以测试一些其他测试方法无法检测的故障，进一步提高故障覆盖率。
• The current based test method can be divided into two categories , the one is quiescent current test ( iddq testing ) and the other is transient current test ( iddt testing )
  为了降低测试成本并且提高集成电路的可靠性,电流测试应运而生。电流测试技术包括稳态电流测试( iddqtesting ) 、瞬态电流测试( iddttesting )两种方法。
• Quiescent current test method has been widely applied in ic industries already and transient current testing is still at the stage of studying due to its harsh requirement for apparatus and other technical problems
  稳态电流测试目前已经实用化,而瞬态电流测试由于其对测试设备要求苛刻和其他一些技术问题仍处于研究阶段。
• On the basis of the analysis on spwm modulation mode and transient current control theory , a new method of voltage balance on the capacitors in dc side is proposed , and computer simulation is carried out in matlab
  在分析了spwm调制方式和瞬态电流控制原理的基础上，提出了一种直流侧两电容上电压平衡的方法，并在matlab环境下进行了计算机仿真。
• Focus on the reality that transient current testing overly relies on the test equipments , professor min yinghua from institute of computing technology of china sicence academy proposed at - speed current testing method ( idda testing ) grounded on transient current testing
  针对瞬态电流测试过于依赖测试设备的现状,中科院闵应骅教授提出了基于瞬态电流的全速电流测试方法( iddatesting ) 。
• Three different d - fronts are defined in this paper , and the test generation is consisted of three parts : to excite the fault at first ; to maximize the iddt difference between fault - free circuit and faulty circuit at second ; and finally to minimize the effect of bypass
  文中定义了三种不同的d前沿，并将测试生成分为三个部分： 1 、激活故障， 2 、使无故障电路和故障电路的瞬态电流差别最大化， 3 、减少旁路的影响。
• By simulating of transient field in the photoconductor of thz photoconductive antenna , the curve of instant electric current was given here , and the result was validated by fdtd method . the influence of transient field to thz out put was mentioned in this paper too
  通过对thz光电导天线中瞬态电场的模拟，得到了芯片内瞬西安理工大学硕士学位论文态电流的变化曲线，并通过fdtd方法对瞬态电流模拟结果进行了验证。
• Based on the analysis and research on fan algorithm , an iddt test pattern generation algorithm for stuck - open faults is present . in the case of ignoring hazards , for the stuck - open faults in cmos circuits , the feasibility of transient current test generation based on fan algorithm is discussed
  本文采用启发式搜索的方法，基于对fan算法的分析，在不考虑冒险的情况下对于cmos电路中的开路故障，探讨了利用fan算法进行瞬态电流测试生成的可能性。
• For the convenience of test , varied circuit chip defects caused by the production process are abstracted as all kinds of models . at present the commonly used fault models mainly consist of stuck - at fault , stuck - open fault , bridge fault , store fault , delay fault , etc . testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years . bridge fault is tested easily by quiescent power supply current ( iddq ) testing method . in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing , it can is tested by the dynamic current ( iddt ) testing
  为了便于测试,我们将生产过程中集成电路出现的多种多样的缺陷抽象为各种模型。目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。电压测试主要针对固定型故障模型,多年的研究也取得了令人满意的结果; cmos电路中的桥接故障则宜用稳态电流测试方法( iddq )测试;对于电压和稳态电流难以测试的开路故障,可以使用瞬态电流测试( iddt )的方法进行测试。

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