集成电路测试的英文

• integrated circuit test

• "集成电路"英文翻译    integrated circuit; unicircu ...
• "测试"英文翻译    test; testing; checkout; mea ...
• "集成电路测试过程" 英文翻译 :    integrated circuit testing procedure
• "集成电路测试机" 英文翻译 :    ic tester
• "集成电路测试夹" 英文翻译 :    integrated circuit test clip
• "集成电路测试器" 英文翻译 :    integrated circuit tester
• "集成电路测试系统" 英文翻译 :    integrated circuit test system
• "集成电路测试仪" 英文翻译 :    ic test instrument
• "大规模集成电路测试" 英文翻译 :    lsi testing
• "大规模集成电路测试系统" 英文翻译 :    lsi testing system
• "逻辑集成电路测试仪" 英文翻译 :    logic integrated circuit tester
• "数字集成电路测试仪" 英文翻译 :    digital integrated circuit measuring-testing i trument; digital integrated circuit measuring-testing instrument
• "线性集成电路测试仪" 英文翻译 :    linear ic tester
• "集成电路测量仪" 英文翻译 :    integrative circuit measuring instrument
• "接口混合式超大规模集成电路测试系统" 英文翻译 :    vxi-based mixed mode vlsi vxi
• "集成电路功能测试仪" 英文翻译 :    integrated circuit functional tester
• "集成电路直流参数测试仪" 英文翻译 :    integrated circuit dc parameter tester
• "线性集成电路自动测试仪" 英文翻译 :    linear integrated circuit automatic tester
• "电路测试" 英文翻译 :    circuit testing
• "电路测试点" 英文翻译 :    circuit test access point
• "电路测试器" 英文翻译 :    circuit tester
• "电路测试仪" 英文翻译 :    circuit tester
• "内电路测试" 英文翻译 :    in-circuit testing (ict); incircuit testingg
• "cad集成电路" 英文翻译 :    cad integrate circuit
• "cmos集成电路" 英文翻译 :    cmos integrated circuit

• Structure of system software of gh3183 integrated circuit tester
  3183集成电路测试仪系统软件的结构
• Methods of expanding the element storehouse of integrated circuit test system
  集成电路测试系统的元件库的扩充方法
• The use of edgeless nmos transistors in place of 2 - edgeless transistors eliminates the excessive radiation - induced edge leakage in many cmos parts after irradiation
  为了测试最新设计的1万门cmos门阵列的抗辐射水平，本文设计了一个cmos集成电路测试样片。
• The general approach for ic test and verification and functional verification technology for processor is first discussed in this paper . then the efforts of author in this simulation - based verification task are expatiated particularly
  本文首先探讨集成电路测试验证的一般方法和处理器的功能验证方法;然后详细阐述笔者在用基于模拟的功能验证对thuasdsp2004处理器进行验证时所做的工作。
• The original test methods mostly used the functional test vectors to test the integrated circuits . in the current , the design for testability ( dft ) techniques have been one of the necessary methods to design the more and more complex very large scale integrated circuits with the deep sub - micro meter technology
  早期的集成电路测试主要通过功能测试向量来完成，但随着系统复杂度的不断提高和工艺技术的日益发展，可测性设计已经成为了集成电路设计所必不可少的辅助设计手段。