From theoretical research and experimental proofs the key factor affecting open - circuit voltage of crystalline silicon solar cell under low illumination is its shunt resistance , which can be a reference for crystalline silicon solar cells utilization under low illumination 理论研究及实验验证得到了弱光下晶体硅太阳电池开路电压主要影响因素是并联电阻,对晶体硅太阳电池在弱光下的应用有指导价值。
Key technologies and its mechanism for improving crystalline silicon solar cells in the scale manufacture have been researched in this thesis . after sioa surface passivation and forming gas treatment utilization in the scale manufacture , the surface recombination and series resistance of solar cells have been reduced while their open - circuit voltage , fill factor and efficiency improved 本论文研究了提高晶体硅太阳电池效率规模化生产工艺技术的主要环节和相关机理,将sio _ 2表面钝化、 forminggas处理用于规模化生产,降低了太阳电池的表面复合速度和串联电阻,提高了开路电压、填充因子和转换效率。
We define the recombination time of excess electrons in p field as the minority carrier lifetime . in theory , we developed the equation between excess minority carriers lifetime and the open - circuit voltage decay ; moreover , the effect of capacitance to general open - circuit voltage is also investigated . both different efficiency solar cells are measured by the method and showed the relations between the minority carrier lifetime and the performance of solar cells , which provides great useful guidelines for fabricating high - efficiency silicon solar cell in industry 根据太阳电池的工作原理,详细地论述了用脉冲光源照射n / p结太阳电池时光电压的产生,理论上给出了注入p区的电子复合带来的开路电压与少子寿命的关系,也研究了n / p结势垒电容放电对开路电压衰减的影响关系,推导了利用开路电压随时间衰减的关系来测量少数载流子寿命的理论公式。
It was first discovered that open - circuit voltage decay in multicrystalline silicon solar cells is smaller than that of in monocrystalline silicon solar cells through electron irradiation , which is explained from electron irradiation mechanism and the structure of multicrystalline silicon solar cells and also has not been reported 通过对晶体硅太阳电池电子辐照,首次发现多晶硅太阳电池的开路电压衰减小于单晶硅太阳电池,从辐照机理和多晶硅太阳电池的结构解释了该现象。本研究未见报道。
Open-circuit voltage (abbreviated as OCV or VOC ) is the difference of electrical potential between two terminals of a device when disconnected from any circuit. There is no external load connected.