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- Mathcad applied to testing of the optical constants for thin films with ellipsometer
- The thickness , extinction and reflection coefficients of the plct ( x ) thin films with variant layers were measured by ellipsometer
- The refractive index ( at 632 . 8nm ) of cbn thin film with 92 . 8 % cubic phase content is measured to be2 . 19 by ellipsometer
用椭偏仪测得，对于波长为632 . 8nm的光，立方相含量为92 . 8的氮化硼薄膜的折射率为2 . 19 。
- The microstructures of the c60 films were studied with scanning electric microscope ( sem ) ; and the optical constants ( including absorption spectrunu refractive index and dielectric function ) of c60 films were measured with the ellipsometer
- Sem was used to observe the surface and the cross section of the films . index of refractive was derived from the ellipsometer . raman spectroscopy and xps were used to analyze the structure and composition of the films