Mathcad applied to testing of the optical constants for thin films with ellipsometer Mathcad在椭圆偏振仪测定薄膜光学常数中的应用
The thickness , extinction and reflection coefficients of the plct ( x ) thin films with variant layers were measured by ellipsometer 运用椭圆偏振仪测定了不同层数的薄膜厚度、消光系数、折射率。
The refractive index ( at 632 . 8nm ) of cbn thin film with 92 . 8 % cubic phase content is measured to be2 . 19 by ellipsometer 用椭偏仪测得,对于波长为632 . 8nm的光,立方相含量为92 . 8的氮化硼薄膜的折射率为2 . 19 。
The microstructures of the c60 films were studied with scanning electric microscope ( sem ) ; and the optical constants ( including absorption spectrunu refractive index and dielectric function ) of c60 films were measured with the ellipsometer 常温和77k温度8衬底上c60膜的制备,以及这两种薄膜的表面结构及光学性质的比较研究。光学参数主要由椭偏仪测量。
Sem was used to observe the surface and the cross section of the films . index of refractive was derived from the ellipsometer . raman spectroscopy and xps were used to analyze the structure and composition of the films 用sem分析了薄膜的断面形态,在椭偏仪上测得其折射率,并对薄膜进行了raman光谱、 xps分析,在没有极化的条件下进行了二阶非线性maker条纹检测。